Presentation Information
[15a-P03-1]Depth Profiling of Electronic Properties of Organic Multi-Layered Films by XPS and TOF-SIMS
〇Takahiko Ikarashi1, Tomohiro Sakata1, Takahiro Shibamori1, Chizuru Asahara1, Hikaru Takano1, Takashi Miyamoto1 (1.TRC)
Keywords:
OLED,XPS,electronic properties
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