Presentation Information

[15p-K307-8]Correction of thin-film-based thermoelectric device characteristics using the effective temperature difference

〇Isao Ohkubo1, Masayuki Murata2, Akihiko Ohi1, Mariana S. L. Lima3, Takeaki Sakurai3, Takashi Aizawa1, Takao Mori1 (1.NIMS, 2.AIST, 3.Univ. of Tsukuba)

Keywords:

Thermoelectric devices,Thin films

Miniaturized in-plane π-type thermoelectric devices based on an epitaxial thin film of the II-IV compound thermoelectric semiconductor Mg2Sn0.8Ge0.2 were developed utilizing the microfabrication techniques of photolithography and dry etching. Our thermoelectric devices contain many π junctions. The electrical and thermal contacts at each π junction are not uniform, making it difficult to compare device characteristics among devices. Therefore, in this study, we attempted to develop a correction method for thermoelectric device characteristics that considers the effective temperature difference.

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