[16a-K301-1~13] 13.7 Compound and power devices, process technology and characterization

10:15 AM - 10:30 AM JST(1:15 AM - 1:30 AM UTC)

[16a-K301-6] Evaluation of interface state density based on an approximate expression for the drain current considering electron capture by interface states

〇Ryuya Kobayashi¹, Hajime Tanaka¹, Nobuya Mori¹ (1.Osaka Univ.)

Keywords:

semiconductor,interface states