Presentation Information

[16a-K307-5]Observation of fluctuating heat current across capacitively-coupled silicon nanometer-scale dots

〇Kensaku Chida1, Antoine Andrieux1, Katsuhiko Nishiguchi1 (1.NTT BRL)

Keywords:

Silicon nanodevices,Electron counting statistics,Heat current

We observed fluctuating heat current across capacitively-coupled silicon nanometer-scale dots with the cross-correlation of thermal single-electron motion.

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