[16a-K504-1~6] 6.6 Probe Microscopy

10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-3] External Field Response Analysis on Two-body Interaction Force in Molten Metals

〇(M2)Yuto Nishiwaki¹, Toru Utsunomiya¹, Ken-ichi Amano², Takashi Ichii¹ (1.Kyoto Univ., 2.Meijo Univ.)

Keywords:

molten metals,particle dispersion,AFM

The two-body interactive force in molten metal was analyzed by atomic force microscopy (AFM) under an external electric field. The strong attractive forces between a tungsten (W) tip and a SiO_x/Si substrate in molten Ga was suppressed by applying an external high voltage (≤±80 V) to the Si inside the SiO_x/Si substrate, irrespective of the polarity (direction) of the applied electric field. This response corresponds to the suppression of the van der Waals force between two bodies by an external electric field, which is calculated based on a nonlinear statistical mechanics model.