The 72nd JSAP Spring Meeting 2025
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Session Details

Oral presentation6 Thin Films and Surfaces : 6.6 Probe Microscopy

[16a-K504-1~6]6.6 Probe Microscopy

Sun. Mar 16, 2025 10:00 AM - 11:30 AM JST
Sun. Mar 16, 2025 1:00 AM - 2:30 AM UTC
K504 (Lecture Hall Bldg.)
Yoichi Otsuka(Osaka Univ.)
10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-1]Development for detection of work in transient phenomena using atomic force microscope

〇Tomohiro Shigeno1, Yuuki Yasui1, Yoshiaki Sugimoto1 (1.Univ. Tokyo)
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10:15 AM - 10:30 AM JST(1:15 AM - 1:30 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation AwardEnglish Presentation

[16a-K504-2]Adsorption Dynamics of Trisodium Citrate Dihydrate on NaCl Surface

〇(D)Voni Fulitasari1, Yuki Araki1, Toyoko Arai1 (1.Kanazawa Univ.)
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10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-3]External Field Response Analysis on Two-body Interaction Force in Molten Metals

〇(M2)Yuto Nishiwaki1, Toru Utsunomiya1, Ken-ichi Amano2, Takashi Ichii1 (1.Kyoto Univ., 2.Meijo Univ.)
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10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-4]Atomic observations of clean and hydrogenated diamond (001) surfaces

〇Yuuki Yasui1, Runnan Zhang1, Masahiro Fukuda2, Taisuke Ozaki2, Masahiko Ogura3, Toshiharu Makino3, Daisuke Takeuchi3, Yoshiaki Sugimoto1 (1.GSFS, Univ. Tokyo, 2.ISSP, Univ. Tokyo, 3.AIST)
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11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-5]Nanoscale mechanical property imaging on epithelial cells

〇Yuto Kunitatsu1, Koichi Mori1, Junichi Usuda1, Hiroki Ida1, Yasufumi Takahashi1,2 (1.Nagoya Univ., 2.Kanazawa Univ.)
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11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-6]Development of variable-time-sweep local CV profiling method using time-resolved scanning nonlinear dielectric microscopy with under-sampling technique

〇(M1)Tomohiro Suzuki1,2, Kohei Yamasue2 (1.Tohoku Univ., 2.RIEC, Tohoku Univ.)
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