[16p-K102-1~8] New developments in magnetics and spintronics with imaging techniques

4:15 PM - 4:45 PM JST(7:15 AM - 7:45 AM UTC)

[16p-K102-6] Progress of Alternating Magnetic Force Microscopy (A-MFM) for Achieving High Spatial and Time Resolution

〇Saito Hitoshi¹ (1.Akita Univ.)

Keywords:

magnetic force microscopy

Alternating magnetic force microscopy (A-MFM) achieved higher spatial resolution than conventional MFM by enabling magnetic force detection near the sample surface. A-MFM also enables the polarity and zero detection of magnetic force. Currently, the minimum spatial resolution is about 3 nm, and the measurable magnetic field frequency range is from DC to about 40 GHz. A-MFM can observe not only weak magnetic fields but also strong magnetic fields. In the presentation, I will introduce these imaging techniques by showing the typical results.