[17p-K405-1~8] 12.5 Organic and hybrid solar cells

1:30 PM - 1:45 PM JST(4:30 AM - 4:45 AM UTC)

[17p-K405-3] Study of Charge Recombination and Lattice Strain at the Interfaces of Tin-Based Perovskite Solar Cells

〇Dong Liu¹, Yusheng Li¹, Liang Wang¹, Dandan Wang¹, Jiaqi Liu¹, Shuzi Hayase¹, Qing Shen¹ (1.Univ. of Electro-commun.)

Keywords:

Tin perovskite,Cairrer dynamics,Lattice strain

Tin based perovskite (Sn-PVK) material has attracted a lot of attention in the photovoltaic field due to its excellent photoelectric characteristics and non-toxicity. In this study, we utilized time-resolved photoluminescence (TRPL) and transient photovoltage (TPV) techniques to analyze the charge carrier dynamics at the interfaces. We found that the defects at the Sn-PVK/ETL interface is more significant than that at the HTL/Sn-PVK interface. Additionally, we estimated the lattice strain and defect concentration at the interface using techniques such as grazing-incidence X-ray diffraction (GIXRD) and capacitance-voltage (C-V) measurements. As a result, the defect concentration at the ETL/Sn-PVK interface are indeed more significant compared to those in the bulk.