[17p-K503-1~12] 6.6 Probe Microscopy

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)

[17p-K503-10] Combination of infrared spectroscopy with dissipation measurements using frequency modulation atomic force microscopy

〇(M2)Nobuhiko Utsunomiya¹, Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa Univ., 2.Japan Advanced Institute of Science and Technology)

Keywords:

atomic force microscopy