Session Details

[17p-K503-1~12]6.6 Probe Microscopy

Mon. Mar 17, 2025 1:00 PM - 4:30 PM JST
Mon. Mar 17, 2025 4:00 AM - 7:30 AM UTC
K503 (Lecture Hall Bldg.)
Takashi Ichii(Kyoto Univ.), Yoshiaki Sugimoto(Univ. of Tokyo)

[17p-K503-1][INVITED] Local Probing of 2D Quantum Materials at Ultra-Low Temperatures

〇Dilek Yildiz1,2 (1.Univ. of Maryland, 2.NIST)
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[17p-K503-2]Development of Quantum Spin STM (2)

〇Koki Yahiya Achmad1, Tomoya Kashiwagi1, Mai Niida1, Haruto Shibahara1, Fabian Calleja2, Garnica Manuela2, Amadeo L. Vazquez de Parga2, Toyo Kazu Yamada1 (1.Chiba Univ, 2.Univ. Auto. Madrid)
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[17p-K503-3]On-Surface Synthesis of Heisenberg Spin-1/2 Antiferromagnetic Molecular Chains

Kewei Sun1, Chao Nan2, Silveira Orlando2, Fumega Adolfo2, Hanindita Fiona3, Ito Shingo3, Lado Jose2, Liljeroth Peter2, Foster Adam2, 〇Shigeki Kawai1,4 (1.NIMS, 2.Aalto Univ., 3.Nanyang Technol. Univ., 4.Univ. Tsukuba)
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[17p-K503-4]Preparation of high-temperature flame-etched tungsten tips

〇Yuta Okabe1, Nobuhiko Utsunomiya2, Yuki Araki1,2, Masahiko Tomitori3, Toyoko Arai1,2 (1.Kanazawa Univ., 2.Kanazawa Univ. Grad. Nat, 3.JAIST)
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[17p-K503-5]Measurements of surface resistivity of a gold thin film by using FM-AFM

〇(M2)Naoki Shima1, Takahiro Kato1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.Japan Advanced Institute of Science and Technology.)
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[17p-K503-6]Room-Temperature Atomic Manipulation on Ag/Si(111)-(7×7) Surface Using Artificial Intelligence

Junya Okuyama1, Zhuo Diao1, Hayato Yamashita1, 〇Masayuki Abe1 (1.Univ. Osaka)
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[17p-K503-7]Solvation Behavior of Lithium-Ion Battery Electrolytes on Clinochlore Surfaces Studied by Frequency Modulation AFM and Molecular Dynamics Simulation

〇Yilin Wang1, Kei Kobayashi1 (1.Kyoto Univ.)
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[17p-K503-8]Microwave Imaging by Alternating Magnetic Force Microscopy

〇(P)Marina V Makarova1, Keita Hayashi1, Hiroshi Sonobe1, Toru Matsumura1, Nobuaki Kikuchi1, Hitoshi Saito1 (1.Akita University)
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[17p-K503-9]Microscopic Electrical Characterization of Organic Thin-Film Transistors Using Pump-Probe Kelvin-probe Force Microscopy

〇Kazuki Arinaga1, Hibi Kota1, Kei Kobayashi1 (1.Kyoto Univ.)
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[17p-K503-10]Combination of infrared spectroscopy with dissipation measurements using frequency modulation atomic force microscopy

〇(M2)Nobuhiko Utsunomiya1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.Japan Advanced Institute of Science and Technology)
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[17p-K503-11]Parameter determination in parallel plate approximation for tip-sample capacitor

〇Ryota Fukuzawa1,2, Takuji Takahashi2,3 (1.NAIST, 2.IIS, 3.NanoQuine)
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[17p-K503-12]Temperature controlled local DLTS measurement of SiO2/SiC by time-resolved scanning nonlinear dielectric microscopy

〇Kohei Yamasue1, Yasuo Cho2 (1.RIEC, Tohoku Univ., 2.NICHe, Tohoku Univ.)
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