[17p-K503-1~12] 6.6 Probe Microscopy

2:15 PM - 2:30 PM JST(5:15 AM - 5:30 AM UTC)

[17p-K503-5] Measurements of surface resistivity of a gold thin film by using FM-AFM

〇(M2)Naoki Shima¹, Takahiro Kato¹, Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa Univ., 2.Japan Advanced Institute of Science and Technology.)

Keywords:

atomic force microscopy