Presentation Information

[15a-M_124-8]Characterization of Cryogenic GeOI FinFET CMOS

〇WENHSIN CHANG1, X. R. YU2, Y. J. LEE3,4, Y. H. WANG2, T. MAEDA1 (1.AIST, 2.NCKU, 3.TSRI, 4.NYCU)

Keywords:

Ge,CMOS,FinFET