Presentation Information
[15a-M_124-8]Characterization of Cryogenic GeOI FinFET CMOS
〇WENHSIN CHANG1, X. R. YU2, Y. J. LEE3,4, Y. H. WANG2, T. MAEDA1 (1.AIST, 2.NCKU, 3.TSRI, 4.NYCU)
Keywords:
Ge,CMOS,FinFET
Comment
To browse or post comments, you must log in.Log in
