Presentation Information
[15a-S4_203-4]Application study of hydrogen-atmosphere surface-treatment using the Minimal laser heating tool to semiconductor CMOS devices(Ⅲ)
〇kazushige sato1,2, Takashi Chiba1,2, Masao Terada1,2, Kengo Hamada1,2, Yoshiaki Kanamori3, Noriko Miura4, Shinichi Ikeda4, Shiro Hara4 (1.MINIMAL, 2.SAKAGUCHI ELECTRIC HEATERS, 3.TOHOKU UNIV, 4.AIST)
Keywords:
laser heating
Siアイランド形成後に表面処理を施すことでMOSデバイスの信頼性をより向上できる見通しを得た
