Molybdenum (Mo) is a promising candidate for interconnect materials in next-generation ULSI devices. To achieve gap-free filling of high-aspect-ratio structures and low resistivity, bottom-up fill deposition is desirable. In copper electroplating, bottom-up filling is achieved by adding suppressors to inhibit film growth at the trench opening. Aiming to apply this mechanism to vapor phase deposition, this study investigated the inhibition effect of NH3 addition on precursor adsorption in Mo-CVD/ALD processes using Mo(CO)6.
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