Session Details

[15p-70A_101-1~13]Atomic Layer Process (ALP) analysis and application technologies (3)

Sun. Mar 15, 2026 1:30 PM - 6:00 PM JST
Sun. Mar 15, 2026 4:30 AM - 9:00 AM UTC
70A_101 (70th Anniversary Auditorium)

[15p-70A_101-1]Computation of Al2O3 ALD by trimethylaluminum with Kinetic Monte Carlo and neural network potential

〇(M2)Yichen ZOU1, Yuxuan Wu1, Jun Yamaguchi1, Noboru Sato1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.The Univ. Tokyo)

[15p-70A_101-2]Study of the desorption effect on the adsorption of Trimethylaluminum and water ALD

〇Yuxuan Wu1, Noboru Sato1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.Univ. Tokyo)

[15p-70A_101-3]Atomic-Layer Process: Essential for 3D-Nano-Devices in Advanced LSIs

〇Hitoshi Wakabayashi1 (1.Science Tokyo)

[15p-70A_101-4]Development of a gallium precursor for atomic layer deposition of high-purity thin films

〇Fumikazu Mizutani1 (1.Kojundo Chem Lab)

[15p-70A_101-5]Atomic Scale Processing for Quantum Applications

〇Shohei Ito1, ChunTing Shen1, Nick Chittock2 (1.OIKK, 2.OIPT)

[15p-70A_101-6]Significant Improvement of Contact Performance by Low Damage Atomic Layer Etching

〇Akiko Hirata1, Masanaga Fukasawa1, Hiroyuki Ota1, Atsushi Yagishita1, Tetsuya Ueda1, Kenzou Manabe1, Wataru Mizubayashi1, Yoshihiro Hayashi1, Meishoku Masahara1 (1.SFRC AIST)

[15p-70A_101-7]Comparison of HF Etching Characteristics of HfO2 Thin Films Deposited by Thermal and Plasma-Enhanced Atomic Layer Deposition

〇Naohiro Furutani1, Matsuo Kohei1, Kobayashi Takayuki1 (1.Samco Inc.)

[15p-70A_101-8]High-Throughput SiN-ALD and Selective Deposition Enabled by Hydrazine

〇(D)Hayato Murata1,2, Yoshifumi Wada2, Hideharu Shimizu2, Takeshi Momose3 (1.GSST, Kumamoto Univ., 2.TAIYO NIPPON SANSO, 3.REISI, Kumamoto Univ.)

[15p-70A_101-9]Study on the effect of NH3 addition in Mo-CVD/ALD using Mo(CO)6 as precursor

〇Soga Nagai1, Soken Obara1, Jun Yamaguchi1, Noboru Sato1, Yuhei Otaka1, Naoki Tamaoki1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.Univ. Tokyo)

[15p-70A_101-10]Process development of area-selective Co-ALD using in-situ spectroscopic ellipsometry

〇Naoki Tamaoki1, Jun Yamaguchi1, Noboru Sato1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.Univ. Tokyo)

[15p-70A_101-11]Prediction of Vapor Pressure Parameters Based on Adsorption Free Energy Calculations of ALD Precursors Using uMLIP

〇Yusuke Asano1 (1.Matlantis Corp.)

[15p-70A_101-12]Development of novel Co-ALD processes using neural network potential molecular

〇(P)Noboru Sato1, Keisuke Tanichi1, Naoyuki Hoshiya2, Akiyoshi Yamauchi2, Shigehito Sagisaka2, Yosuke Kishikawa2, Jun Yamaguchi1, Naoki Tamaoki1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.The Univ. of Tokyo, 2.Daikin Ind.)

[15p-70A_101-13]Surface reaction analysis of area-selective Co-ALD by using MLPs

〇Naoki Tamaoki1, Jun Yamaguchi1, Noboru Sato1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.Univ. Tokyo)