Presentation Information
[15p-M_124-12]The variation in WSe2 FET induced by the strain during electrodes deposition
〇Ryuichi Nakajima1, Tomonori Nishimura1, Kaito Kanahashi1, Keiji Ueno2, Takahiko Endo3, Yasumitsu Miyata3, Kosuke Nagashio1 (1.The Univ. of Tokyo, 2.Saitama Univ., 3.NIMS)
Keywords:
WSe2,p-FET,Strain
The variation of electrical properties in WSe2 FETs was induced by the strain during electrdoes deposition. Using the continous WSe2 film grown by CVD, the modulation of the band alignment could be estimated.
