Presentation Information

[15p-SL_101-17]Conduction Characteristics in Epitaxial Pt/AlScN/TiN Heterostructures

〇Koki Yasuoka1, Yusuke Aoki1, Norifumi Fujimura1, Takeshi Yosimura1 (1.Osaka Metro. Univ.)

Keywords:

ferroelectric thin films,AlScN,Ferroelectric diode

Al1-XScXN (AlScN), which exhibits a large spontaneous polarization and CMOS compatibility, has attracted significant attention as a next-generation memory material since the discovery of its ferroelectricity. In this study, with the aim of fabricating a ferroelectric diode (FeD), a metal/ferroelectric/metal structure was prepared by sandwiching an epitaxial AlScN thin film between Pt and TiN electrodes on a Si substrate. From the obtained electrical characteristics, we investigated the effects of the electrode work function difference and ferroelectric polarization on the conduction mechanism.

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