Presentation Information
[16a-S2_203-6]Process Optimization for High-Thermal Conductivity, Low-Temperature-Grown AlN for 3DIC/TSV by FM-CVD
〇(P)Yuhei Otaka1, Lu Yin-Chi1, Hatakeyama Daiki1, Jun Yamaguchi1, Tamaoki Naoki1, Noboru Sato1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.Univ. Tokyo)
Keywords:
3DICs,AlN,FM-CVD
We improved a flow-modulated chemical vapor deposition method, in which NH3 is supplied continuously and TMA intermittently, to form AlN thin films inside TSVs for three-dimensional integrated circuits at low temperatures around 673 K with high deposition rate and excellent step coverage. By thoroughly investigating the dependence on various process parameters, we propose a low-temperature process capable of achieving high thermal conductivity. As a result, AlN films with a thermal conductivity of up to 10.9 W/mK were obtained.
