Presentation Information
[16a-W8E_307-5]The effect of growth direction on stress and dislocation density distributions in a Ga2O3 crystals grown by VB method
〇Koichi Kakimoto1, Taketoshi Tomida2, Vladimir Kochurikhin2, Masanori Kitahara2, Kei Kamada1, Rikito Murakami1, Satoshi Nakano3, Yao Yongzhao4, Kazuaki Akaiwa5, Akira Yoshikawa1,2 (1.IMR, Tohoku Univ., 2.C & A co., 3.RIAM, Kyushu Univ., 4.Mie Univ., 5.Tottori Univ.)
Keywords:
semiconductor,Ga2O3,simulation
This paper reports the calculated results of temperature and dislocation density in VB-grown Ga2O3 using timedependent 3D method. The results show that dislocation density is small in a c-axis grown crystal.
