Presentation Information
[16p-PB2-9]Measurement of the Sample-Intrinsic Work Function of Gold Surfaces at Atomic Resolution Using Voltage-Pulse Scanning Probe Microscopy
〇Takeshi Susowake1, Yukichi Ito1, Daiki Katsube2, Masayuki Abe3, Eiichi Inami1 (1.Kochi Univ. Tech., 2.JFCC, 3.Osaka Univ.)
Keywords:
scanning probe microscopy,work function,Au(111)
Improving the performance of optical and electronic nanodevices requires high-resolution evaluation of the work function (WF). Although scanning probe microscopy (SPM) techniques are widely used for high-resolution WF measurements, observables such as the tunneling barrier height (BH) and contact potential difference (CPD) include contributions from the probe WF, preventing direct evaluation of the intrinsic WF of the sample. To overcome this limitation, we have developed a pulse-SPM technique that integrates SPM with voltage pulse control. By simultaneously measuring BH and CPD, this method enables direct and quantitative high-resolution evaluation of the intrinsic sample WF. In this study, we verify the measurement principle of pulse-SPM using a gold surface, for which the WF is well established. We present the measurement principle and the acquired data to discuss the validity of the proposed approach.