Presentation Information
[17a-M_278-1]Orientation dependencies of ferroelectric and piezoelectric properties in CeO2-HfO2 thick films
〇Shunshi Imamura1, Kazuki Okamoto1, Yukari Inoue2, Hiroshi Funakubo1 (1.Science Tokyo, 2.TDK Corp.)
Keywords:
ferroelectric,Hafnium oxide,PLD method
Comment
To browse or post comments, you must log in.Log in
