Presentation Information
[17p-S2_203-5]Research on Organic Electronic Materials Using Field Emission Angular Distribution
〇Yoichi Yamada1 (1.Tsukuba Univ.)
Keywords:
Field Emission,Organic semiconductors,Graphene
Field-emission microscopy (FEM) and field-ion microscopy (FIM) are early projection-type surface microscopes. Although they are rarely used in contemporary materials research, their ability to deliver atom-/molecule-resolved projection images in the real time remains unique among surface-science techniques. This talk presents an example of applying FEM/FIM to organic-electronics materials. In parallel with the rapid progress of photoelectron tomography—which reconstructs an electronic orbital from photoemission angular distribution (PAD) patterns—we focus on field-emission angular distributions (FAD). We discuss whether FAD patterns from molecular materials can encode usable information on the emitting orbital, and outline experimental/analysis strategies and current limitations.