Presentation Information
[18a-PA3-9]Theoretical analysis for structural stability of rutile-type GeO2 surfaces
〇(B)Yuki Murakami1, Toru Akiyama1,2, Takahiro Kawamura1,2 (1.Mie Univ., 2.ICSDF Mie Univ.)
Keywords:
oxide semiconductor,surface,GeO2
oxide semiconductor,surface,GeO2