[1A01-03] Plenary/Keynote speeches

10:00 AM - 10:50 AM JST(1:00 AM - 1:50 AM UTC)

[1A01] Development of innovative nanoscale measurement techniques based on force detection, and research on charge transport phenomena and optical properties

*Yasuhiro Sugawara¹ (1. Graduate School of Engineering, The Univerisity of Osaka (Japan))

We development of innovative nanoscale measurement techniques based on force detection (atomic force microscopy). We also advanced research on the Kelvin probe force microscopy (KPFM) for measuring the surface potential and band-bending of the semiconductor surfaces on an atomic scale using AC bias voltages with frequencies higher and lower than the cutoff frequency f_c of carrier (electrons and holes) transport between the surface and bulk states. Furthermore, we advanced research on photoinduced force microscopy (PiFM) for measuring nanoscale optical properties by applying AFM to the detection of optical forces.

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