Presentation Information

[2A03【依頼講演】]Nanoscale Deformation-Induced Impulsive Charging in PFDT Monolayers via Intermittent Contact AFM

Masahiro Nakayama1, Hiroshi Ohoyama1, Takashi Yamada1, Tomoki Misaka1, *Takuya Matsumoto1,2 (1. Osaka University (Japan), 2. Kyushu Institute of Technology (Japan))
The spike-occurrence rate follows an approximately one-third-power dependence on loading-force, consistent with edge strain predicted by Hertzian contact mechanics and with scaling behavior observed for flexoelectric charging in bulk systems. The spike-occurrence rate also shows a clear sample-bias voltage dependence, suggesting that the charging process may involve alignment between molecular orbitals and the tip Fermi level. Density functional theory calculations further indicate that structural deformation of PFDT can modify its electronic states and lower the LUMO energy, thereby facilitating electron transfer. These results demonstrate that deformation-induced charging can occur in molecular monolayers and may represent a nanoscale manifestation of flexoelectric-like charging. The combined dependence of loading-force and bias indicates that mechanical deformation and energy-level alignment cooperatively govern charge generation, providing new insight into the microscopic origin of triboelectric phenomena and offering guidance for the molecular design of triboelectric materials.

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