Presentation Information
[2D12【招待講演】]Development of ultrahigh-vacuum micro-scaled multiprobe system and elucidation of surface electron transport
*Ryu Yukawa1 (1. Tohoku University (Japan))
Surfaces and atomic-layer thin films exhibit electronic properties distinct from those of bulk crystals, but their intrinsic transport is difficult to measure because air exposure and electrode fabrication can modify the surface. We developed an ultrahigh-vacuum microscale multiprobe system for direct electrical measurements on clean surfaces and atomic-layer materials. We demonstrated that the positions of multiple probes can be determined using three reference probes and multichannel current-voltage measurements. Furthermore, using the developed system, we succeeded in determining the transport gap of one-dimensional atomic wires on Si. These results demonstrate that UHV microscale multiprobe measurements provide a powerful approach for quantitatively elucidating intrinsic electron transport in surfaces and low-dimensional atomic-layer materials.
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