Presentation Information
[3A07【依頼講演】]Neutron reflectometry for nanoscale structure analysis of surfaces and interfaces
*Kazuhiro Akutsu1, Takayasu Hanashima1 (1. Neutron Science and Technology Center, Comprehensive Research Organization for Science and Society (Japan))
Material surfaces and interfaces often exhibit properties distinctly different from their bulk counterparts, meaning that controlling these nanoscale structures can directly modulate material functions. Unpolarized and polarized neutron reflectivity (NR and PNR) are uniquely suited for analyzing the nanoscale structures of surfaces and interfaces, providing nanometer-resolution depth profiles of both chemical and magnetic structures. To advance these capabilities, we have developed novel experimental methodologies, focusing on a weak magnetic field sample environment and a system for simultaneous measurements combined with spectroscopic techniques. As a PNR application, a complex SiO2/Fe/MgO magnetic thin film was analyzed under a weak magnetic field of +10 Oe. This approach allowed for the accurate estimation of both the nuclear and magnetic scattering length density (SLD) profiles of the Fe layer.
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