Presentation Information
[3D05]Potential-dependent Ag+ transport at ionic liquid/electrode interfaces governed by the interfacial solvation layer revealed by operando EC-XPS
*Akihito Imanishi1, Yosei Uotani1, Ken-ichi Fukui1 (1. Graduate School of Engineering Science, The University of Osaka (Japan))
Ionic liquids are promising electrolytes for electrochemical devices, but the relationship between the interfacial solvation layer and metal-ion transport remains unclear. Operando electrochemical X-ray photoelectron spectroscopy (EC-XPS), chronoamperometric analysis, and diffusion simulations were combined to investigate potential-dependent Ag+ transport near ionic liquid/Pt electrode interfaces. The apparent diffusion coefficient exhibited a pronounced minimum around −1.2 V vs. Fc/Fc+. Operando EC-XPS revealed potential-dependent changes in Ag+ concentration profiles, and comparison with diffusion simulations showed that the potential dependence mainly originates from diffusion changes within the interfacial solvation layer. The results suggest that hopping diffusion is suppressed near −1.2 V owing to compression of the interfacial solvation layer. These findings demonstrate that potential-dependent changes in the interfacial solvation layer govern Ag+ transport and that operando EC-XPS provides a quantitative approach for correlating interfacial structure with ion transport.
Password required to view
Comment
To browse or post comments, you must log in.Log in