Presentation Information
[J-1-03]Large-Scale Characterization Classifying Double Quantum Dots in Isoelectronic-Trap-Assisted Tunnel Field-Effect Transistors
〇Yusuke Chiashi1, Takumi Inaba1, Atsushi Yagishita1, Makoto Kato1, Tomohiro Ishikawa1, Oka Hiroshi1, Kimihiko Kato1, Hidehiro Asai1, Minoru Ogura1, Shota Iizuka1, Takahiro Mori1 (1. Advanced Industrial Science amd Technology(AIST) (Japan))