[PS-04] 04: Power / High‐speed Devices and Materials

[PS-04-05] Characterization and Analysis on ESD Robustness of SiC VDMOSFET

〇Chao-Yang Ke¹, Ya-Zhi Hu¹, Ming-Dou Ker¹ (1. Inst. of Electronics, National Yang Ming Chiao Tung Univ. (Taiwan))

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