Presentation Information
[PS-09-08]Effect of Interface Trap Charge on Coulomb Oscillation in MOS-type Quantum Dots
〇Hidehiro Asai1, Shota Iizuka1, Junichi Hattori1, Koichi Fukuda1, Tsutomu Ikegami1, Hiroshi Oka1, Takumi Inaba1, Shunsuke Shitakata1, Kimihiko Kato1, Takahi Nakayama1, Takahiro Mori1 (1. National Institute of Advanced Industrial Science and Technology (Japan))