[SO-PS-01] 01: Advanced CMOS: Material Science / Process Engineering / Device Technology

1:58 PM - 2:00 PM JST(4:58 AM - 5:00 AM UTC)

[SO-PS-01-15] Analysis of AC Degradation in SiON pMOSFET by Extraction of Threshold Voltage Degradation Profile

〇Donghee Son¹, Yeohyeok Yun² (1. Samsung Electronics (Korea), 2. Korea University of Technology and Education(KOREATECH) (Korea))

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