Presentation Information
[SO-PS-01-16]Atomic-Scale Insights into the Effects of Biaxial Strain on the Electronic Structure of Orthorhombic Hf0.5Zr0.5O2
〇Yu Hong Chen1、Chen You Wei2、Yi Ju Yao2、Fu Ju Hou3、Guang Li Luo3、Yung Chun Wu1,2 (1. Department of Engineering and System Science, National Tsing Hua University (Taiwan)、2. College of Semiconductor Research, National Tsing Hua University (Taiwan)、3. Taiwan Semiconductor Research Institute (Taiwan))