Presentation Information
[PS-04-13]Investigation of the Drain Bias-Dependent Degradation Behaviors in RF Perfor-mance of AlGaN/GaN HEMTs Subjected to High-Temperature DC Stress
〇Chia-Hui Liu1, Yi-Fan Tsao1, Chun-Yi Hsia1, Ping-Hsun Chiu1, Chen-Hsuan Hung1, Heng-Tung Hsu1 (1. National Yang Ming Chiao Tung University (Taiwan))