2025 International Conference on Solid State Devices and Materials
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Mon. Sep 15, 2025
Tue. Sep 16, 2025
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Thu. Sep 18, 2025
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[PS-04-17]
Bias and Temperature Dependence of Threshold Voltage Instability Induced by Low Drain Bias in E-mode AlGaN/GaN HEMTs
〇Myeongsu Chae
1
, Hyungtak Kim
1
(1. Hongik Univ. (Korea))
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