[PS-08] 08: Low Dimensional Devices and Materials

[PS-08-17] Direct Measurement of the Specific Contact Resistivity in Monolayer MoS₂ using Cross-Bridge Kelvin Probe Structures

〇Aparna -^1,3, Surajit Sutar¹, Kaustuv Banerjee¹, Cesar Javier Lockhart de la Rosa¹, Gouri Sankar Kar¹, Clement Merckling^1,2, Bart Soree^1,3 (1. IMEC (Belgium), 2. Department of Materials Engineering (MTM), KU Leuven (Belgium), 3. Department of Electrical Engineering (ESAT)-KU Leuven (Belgium))