Presentation Information
[PS-11-05]Raman spectroscopy evaluation for solid phase crystallization of amorphous Ge / Mg / SiO2 stacked structure
〇Shota Kikumoto1, Atsuki Morimoto1, Taiga Nagashima1, Kenichiro Takakura1, Isao Tsunoda1 (1. National Inst. of Tech., Kumamoto College (Japan))