[A-4] New device architecture

11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[A-4-02] Critical PPA Examination of SRAMs with VFET Evolutions: From Frontside to Dual-sided and Stacking

〇Xinyue He¹, Siyuan Liu¹, Yuji Cheng¹, Yu Liu¹, Xiangyu Yan¹, Runsheng Wang¹, Ming Li¹, Xing Zhang¹, Heng Wu¹ (1. School of Integrated Circuits, Peking University (China))