Presentation Information
[A-6-06]High Performance GeOI (111) nMOSFETs with Ge-Bi-Te S/D Contact using High-temperature Sputtering Deposition
〇Wen Hsin Chang1, Shogo Hatayama1, Fang-Jui Chu2, Naoya Okada1, Toshifumi Irisawa1, Yao-Jen Lee3, Yeong-Her Wang2, Tatsuro Maeda1, Yuta Saito4 (1. Natl. Inst. Adv. Indus. Sci. Tech. (Japan), 2. Natl. Cheng Kung Univ. (Taiwan), 3. Natl. Yang Ming Chiao Tung Univ. (Taiwan), 4. Tohoku Univ. (Japan))
