Presentation Information
[A-8-06]Monte Carlo Simulation of Electron Transport in MOSFETs Incorporating Impurity-Induced Random Potentials at Cryogenic Temperatures
〇Kaoru Kato1, Hajime Tanaka1,2, Nobuya Mori1 (1. The Univ. of Osaka (Japan), 2. Kwansei Gakuin Univ. (Japan))
