[B-1] Ferroelectric Devices

1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)

[B-1-02] Suppressing Oxygen-Vacancy-Mediated Reliability Degradation and Variability in HZO FeFETs with Lanthanum Oxygen Diffusion Barrier

〇jihoon CHOI¹, Kyung Soo Park¹, Yoonseok Lee¹, Jin Yeong Lee¹, Yeon Woo Choi¹, Gyu Min Hwang¹, Sang Myun Lim¹, Do Hyun Lee¹, Tae Suk Kim¹, Ye Jun Park¹, Changhwan Choi¹ (1. Hanyang university (Korea))