Presentation Information
[B-3-04]Electrode-Dependent Morphotropic Phase Boundary Characteristics in Hf0.2Zr0.8O2 for Advanced DRAM Capacitors
〇Donguk Lee1, Eunjin Kim1, Jaebin Lee2, Seokjae Lim2, Jiyong Woo1 (1. Kyungpook National Univ. (Korea), 2. Gumi Electronics & Information Tech. Res. Inst. (Korea))
