Presentation Information
[PS-03-06 (Late News)]Temperature Distribution Measurement of an On-State GaN-HEMT Device in Lateral and Depth Directions using Raman Thermometry
〇Kensuke Sagawa1, Takuya Hoshii1, Anton Myalitsin2,3, Hiroyuki Ryoson2, Hitoshi Wakabayashi4, Takashi Yoda2, Takayuki Ohba2, Kuniyuki Kakushima1 (1. School of Eng., Science Tokyo (Japan), 2. WOW Alliance, Science Tokyo (Japan), 3. ANVOS Analytics Cor., Ltd. (Japan), 4. Inst. of Integrated Res., ScienceTokyo (Japan))