Presentation Information

[SO-PS-02-06]Hot Carrier Injection Dependence on Select Gate Patterns during GIDL Erase Operation in 3D NAND Flash Memory

〇Jae Hyun Nam1, Jin Ho Chang1, Suk-Kang Sung2, Jun Hyoung Kim2, Woo Young Choi1 (1. Seoul National Univ. (Korea), 2. Samsung Electronics Co. (Korea))