[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

1:58 PM - 2:00 PM JST(4:58 AM - 5:00 AM UTC)

[SO-PS-02-15] Phase-Coexistence Engineering in FE-AFE HZO Bilayer MFM Capacitors for Improved Endurance, Imprint Stability, and Switching Nucleation

〇Tsz Ying Pun¹, Cheng-Hung Wu², Tsung-Ying Lin¹, William Cheng-Yu Ma³, Vita Pi-Ho Hu², Chun-Jung Su^1,4 (1. Dept. Electrophysics, National Yang Ming Chiao Tung Univ. (Taiwan), 2. Graduate Inst. Electronics Engineering, National Taiwan Univ. (Taiwan), 3. Dept. Electrical Engineering, National Sun Yat-sen Univ. (Taiwan), 4. Taiwan Semiconductor Res. Inst., National Inst. of Applied Res. (Taiwan))