[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

2:24 PM - 2:26 PM JST(5:24 AM - 5:26 AM UTC)

[SO-PS-02-28] Positive Bias Stress (PBS) Stability Improved by X-ray Irradiation for IGZO Ferroelectric Field-Effect Transistors

〇Che-Chi Cheng¹, Zao-Feng Lou¹, I-Chun Cheng¹, Min-Hung Lee¹ (1. National Taiwan University (Taiwan))