[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

2:30 PM - 2:32 PM JST(5:30 AM - 5:32 AM UTC)

[SO-PS-02-31] TiO₂ Interlayer Engineering and Recovery Strategies for Enhancing
Cycling-induced Reliability in HfO₂-Based Ferroelectric Capacitors

〇Fei Yu^1,2, Yutai Man², Wanmei Zhang², Xingcheng Jin³, Chongyong Guo³, Hongbo Li³, Huan Liu^1,2, Bing Chen^1,2, Yan Liu^1,2, Xiao Yu^1,2, Genquan Han^1,2 (1. Faculty of Integrated Circuit, Xidian Univ. (China), 2. Hangzhou Inst. of Tech., Xidian Univ. (China), 3. China Resources Microelectronics Ltd. (China))