2026 International Conference on Solid State Devices and Materials
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Tue. Sep 15, 2026
Wed. Sep 16, 2026
Thu. Sep 17, 2026
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1:34 PM - 1:36 PM JST
(4:34 AM - 4:36 AM UTC)
[SO-PS-04-03]
Fin Geometry Effects on Device Characteristics in Wide-Width 30V HV FinFETs for 3D NAND Periphery
〇Sohyeon LEE
1,2
, Jimyoung LEE
1,2
, Jongwook Jeon
1
(1. Sungkyunkwan Univ. (Korea), 2. Samsung Electronics (Korea))
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