Presentation Information

[SO-PS-04-17]Physical Origin and Suppression of Geometric Components in Charge Pumping of 4H-SiC nMOSFETs

〇Shuto Oi1,Mitsuru Sometani2,Hirohisa Hirai2, Mitsuo Okamoto2, Tetsuo Hatakeyama1 (1. Toyama Prefectural Univ. (Japan)、2. National Inst. of Advanced Industrial Science and Technology (AIST) (Japan))