Presentation Information
[SO-PS-08-11]Characterization Strategy for Interfacial Traps and Potential Distribution of Ultrathin 2D-MISFET Channel
〇RYU HASUNUMA1, Masaru Sato1, Yuto Terasaka1, Takeo Matsuki1, Toshifumi Irisawa2, Tomonori Nishimura3, Naoya Okada2, Wen Hsin. Chang2, Akiko Ueda2, Hirokazu Fukidome4, Takahiro Iizuka5, Kosuke Nagashio3 (1. Univ. of Tsukuba (Japan), 2. AIST (Japan), 3. The Univ. of Tokyo (Japan), 4. Tohoku Univ. (Japan), 5. Hiroshima Univ. (Japan))
